MARUYAMA, T. .; FURUNO, T. .; ODA, Y. .; SHEN, J. .; OHYA, T. . Capacitance Value Control for Metamaterial Reflectarray using Multi-layer Mushroom Structure with Parasitic Patches. Applied Computational Electromagnetics Society Journal (ACES), [S. l.], v. 27, n. 1, p. 28–41, 2022. Disponível em: https://journals.riverpublishers.com/index.php/ACES/article/view/15099. Acesso em: 23 jun. 2026.