JORDAN, L. .; ELSHERBENI, D. .; HUTCHCRAFT, E. .; GORDON, R. K. .; KAJFEZ, D. . On-Wafer Measurement and Modeling of Silicon Carbide MESFET’s. Applied Computational Electromagnetics Society Journal (ACES), [S. l.], v. 23, n. 1, p. 76–83, 2022. Disponível em: https://journals.riverpublishers.com/index.php/ACES/article/view/16057. Acesso em: 13 may. 2026.