EICHINGER, W. . THE EFFECTS OF HEAVY CHARGED PARTICLE IRRADIATION OF MOSFET DEVICES. Applied Computational Electromagnetics Society Journal (ACES), [S. l.], v. 3, n. 2, p. 119–130, 2022. Disponível em: https://journals.riverpublishers.com/index.php/ACES/article/view/17889. Acesso em: 24 jun. 2026.