BAI, J. .; HU, B. .; WAN, Y. . Failure Mechanism Analysis of the Stochastic Galerkin Method in EMC Simulation Considering Geometric Randomness. Applied Computational Electromagnetics Society Journal (ACES), [S. l.], v. 38, n. 07, p. 475–481, 2023. DOI: 10.13052/2023.ACES.J.380702. Disponível em: https://journals.riverpublishers.com/index.php/ACES/article/view/19241. Acesso em: 13 may. 2026.