Stochastic Analysis of Redundant RF Amplifiers with Priority Repair and Data-Driven Parameters

Authors

  • Yogita Rani Department of Applied Sciences, BPIT, GGSIPU, Delhi, India
  • Gitanjali Department of Applied Sciences, MSIT, GGSIPU, Delhi, India
  • Indeewar Kumar Department of Mathematics and Statistics, Manipal University Jaipur, Jaipur, India

DOI:

https://doi.org/10.13052/jrss0974-8024.19213

Keywords:

Parallel systems, RF power amplifier module, RF backup amplifier module, reliability analysis, regenerative point technique, semi-Markov process

Abstract

RF amplifier modules provide fundamental and indispensable functionality across diverse domains such as aerospace, defence, medical imaging, industrial automation, and scientific research by ensuring reliable operation and robust signal transmission. Their criticality is amplified in high-end applications for example cellular base stations, radar, and real-time networks dependent. The current work develops a stochastic model for the reliability analysis of a parallel redundant system comprising a primary and a backup RF Power Amplifier Module. Utilizing the semi-Markov Regenerative Point Technique (SMRPT), we compute key metrics like Mean Time to System Failure (MTSF), availability and system’s profit. The system is initially fully operational and fails only when both units fail. A dedicated server performs immediate, flawless repairs upon failure, prioritizing the primary module. The study assumes constant failure rates and exponentially distributed repair times. To estimate the failure and repair rates from empirical data, a linear regression technique which is one of the fundamental supervised learning methods in AI and machine learning, is utilized. The observed repair and failure times are considered as dependent variables and the rates are approximated as the inverse of the mean observed times.

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Author Biographies

Yogita Rani, Department of Applied Sciences, BPIT, GGSIPU, Delhi, India

Yogita Rani is an accomplished Assistant Professor in the Department of Mathematics at Bhagwan Parshuram Institute of Technology, located in Rohini, Delhi. In addition to her teaching responsibilities, she is actively pursuing her research as a scholar at Manipal University, Jaipur. Her dual role as an educator and researcher reflects her commitment to advancing knowledge in the field of mathematics.

Gitanjali, Department of Applied Sciences, MSIT, GGSIPU, Delhi, India

Gitanjali is a multifaceted academic professional, dedicated to the realm of reliability theory and modeling. With a specialization in Reliability Modeling, she has honed her expertise through 20 years of teaching in the Department of Applied Sciences at Maharaja Surajmal Institute of Technology, conducting research, and guiding aspiring scholars in this field. She employs statistical distributions as a powerful tool to meticulously analyze various repairable hardware devices. Her passion lies in the utilization of the semi-Markov process and the regeneration point technique to skillfully manage stochastic systems. She has also recognized for her extensive contributions to reputable journals through her research papers. She has also authored numerous mathematics textbooks and reference books, establishing herself as a respected figure in both academia and publishing.

Indeewar Kumar, Department of Mathematics and Statistics, Manipal University Jaipur, Jaipur, India

Indeewar Kumar earned his Ph.D. in Boundary Layer Theory and Operations Research from VinobaBhave University, reflecting his deep expertise in these specialized areas. Currently, he serves as an Associate Professor in the Department of Mathematics and Statistics at Manipal University, Jaipur. With a distinguished academic career, Dr. Kumar has contributed significantly to his field through numerous research publications, particularly in the areas of operations research and boundary layer theory.

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Published

2026-09-15

How to Cite

Rani, Y., Gitanjali, & Kumar, I. (2026). Stochastic Analysis of Redundant RF Amplifiers with Priority Repair and Data-Driven Parameters. Journal of Reliability and Statistical Studies, 19(02), 555–586. https://doi.org/10.13052/jrss0974-8024.19213

Issue

Section

Advances in Reliability Studies