YADAV, A. S. .; SAHA, M. .; SHUKLA, S. .; TRIPATHI, H. .; DEY, R. . Reliability Test Plan Based on Logistic-Exponential Distribution and Its Application. Journal of Reliability and Statistical Studies, [S. l.], v. 14, n. 02, p. 695–724, 2021. DOI: 10.13052/jrss0974-8024.14215. Disponível em: https://journals.riverpublishers.com/index.php/JRSS/article/view/20357. Acesso em: 3 jun. 2026.