CHOI, J. .; KIM, T. .; RYU, D. .; BAIK, J. .; KIM, S. . Just-in-Time Defect Prediction for Self-driving Software via a Deep Learning Model. Journal of Web Engineering, [S. l.], v. 22, n. 02, p. 303–326, 2023. DOI: 10.13052/jwe1540-9589.2225. Disponível em: https://journals.riverpublishers.com/index.php/JWE/article/view/23075. Acesso em: 14 jul. 2024.