Choi J, Kim T, Ryu D, Baik J, Kim S. Just-in-Time Defect Prediction for Self-driving Software via a Deep Learning Model. JWE [Internet]. 2023 Jun. 21 [cited 2024 Jul. 14];22(02):303-26. Available from: https://journals.riverpublishers.com/index.php/JWE/article/view/23075