Dissipation Factor and Permittivity Estimation of Dielectric Substrates Using a Single Microstrip Line Measurement

Authors

  • Ricardo Gonçalves DETI, Instituto de Telecomunicações Universidade de Aveiro, 3810-193 Aveiro, Portugal
  • Roberto Magueta DETI, Instituto de Telecomunicações Universidade de Aveiro, 3810-193 Aveiro, Portugal
  • Pedro Pinho Instituto de Telecomunicações Instituto Superior de Engenharia de Lisboa, 1959-007 Lisboa, Portugal
  • Nuno B. Carvalho DETI, Instituto de Telecomunicações Universidade de Aveiro, 3810-193 Aveiro, Portugal

Keywords:

Dielectric characterization, loss factor estimation, microwaves, permittivity estimation

Abstract

The knowledge of the dielectric properties of materials, for the design of several components and circuits at high frequencies, is mandatory. In this paper, we present a simple method for the estimation of the dissipation factor (loss tangent) of dielectric materials based on the reflection measurement of a single microstrip line, which is applied to some common known materials, such as FR-4 and Rogers RO3010 laminates. The obtained results match well with the data on the literature for the considered materials.

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References

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Published

2021-08-18

How to Cite

[1]
R. . Gonçalves, R. . Magueta, P. . Pinho, and N. B. . Carvalho, “Dissipation Factor and Permittivity Estimation of Dielectric Substrates Using a Single Microstrip Line Measurement”, ACES Journal, vol. 31, no. 02, pp. 118–125, Aug. 2021.

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