Influence of the Simulation Parameters on the Normalized Impedance Derived by the Random Coupling Model Simulation
Keywords:
Cavity loss parameter, normalized impedance matrix, random coupling modelAbstract
The random coupling model (RCM, introduced by the “chaos group” in the University of Maryland, is found of great use in making statistical predictions of the induced voltages and currents on objects or components within complicated (wavechaotic) cavities when excited by external high power microwave (HPM) radiation. A key point to applying the RCM to a real system is to generate the normalized cavity impedance, which can be described by the random matrix theory (RMT), from the cavity loss parameter by using random matrix Monte Carlo simulation. The influences of the simulation parameters on the statistics of the generated normalized impedance are presented and discussed in this paper. It’s found that the statistics of the normalized impedance only depends on the loss parameter, ?, which agrees with the theory. When ? increases, the variances of the eigenvalues, the diagonal elements and the off-diagonal elements of the normalized impedance are exponentially damped with different damping factor, which are experimentally verified in the paper.
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References
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