Time Domain Analysis of GaAS MESFET Transistors Excited by an Incident Electromagnetic Field
Keywords:
Coupled active transmission lines, Electromagnetic Interference (EMI), Field Effect Transistor (FET), Finite-Difference Time-Domain (FDTD), incident wave, transistor distributed modelingAbstract
A numerical method for the fully distributed modeling of Field Effect Transistor (FET) excited by an incident electromagnetic field using a Finite-Difference Time-Domain (FDTD) method is described. The transistor is modeled using the fully distributed model which consists of a configuration of the conventional equivalent circuit of the transistor and three coupled lines as each distributed element. The distributed source terms represent the coupling with an electromagnetic field in the equation which can be used in the Electromagnetic Interference (EMI) analysis. As a numerical example, the method is applied to a GaAs MESFET and the time domain results are presented.
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References
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