An Efficient 2D Rough Surface Scattering Analysis Using Strong Harmonics Extraction and the Kirchhoff Approach
Keywords:
Electromagnetic scattering by rough surfaces, Fourier series, Kirchhoff approach, method of moments, Ray tracingAbstract
An efficient method for scattering analysis from slightly rough surfaces is introduced. This method can be used in ray tracing algorithm where the computational efficiency is important due to the complexity and size of problems. In this method, the Kirchhoff approach is used for a periodic extension of the finite surface, which is approximated by strong harmonics of its Fourier series. Typical asphalt surfaces are analyzed by this method in millimeter-wave band and validated with the method of moments. The dominant scattering angles and ray widths of the scattered field can be easily used in ray tracing algorithm. The computation time and accuracy of results show that this method can be used for rough surface scattering analysis in ray tracing algorithm efficiently.
Downloads
References
ITU-R-P.1410, “Propagation data and prediction methods required for the design of terrestrial broadband radio access systems operating in a frequency range from 3 to 60 GHz,” 2007.
W. Ament, “Toward a theory of reflection by a rough surface,” IRE Proc., vol. 41, no. 1, pp. 142- 146, 1953.
J. Kong and L. Tsang, Scattering of Electromagnetic Waves (Numerical Simulations), vol. 2, John Wiley & Sons, 2001.
J. Li, L. X. Guo, and H. Zeng, “FDTD investigation on electromagnetic scattering from two-dimensional layered rough surfaces,” Applied Computational Electromagnetics Society (ACES) Journal, vol. 25, no. 5, pp. 450-457, May 2010.
A. Fung, Microwave Scattering and Emission Models and Their Applications, Artech House Inc., 1994.
P. Bekkmann and A. Spizzicino, The Scattering of Electromagnetic Waves from Rough Surface, Artech House, 1987.
Y. Oh and K. Sarabandi, “Improved numerical simulation of electromagnetic wave scattering from perfectly conducting random surfaces,” IEE Proceedings: Microw. Antennas Propag., vol. 144, no. 4, pp. 256-260, 1997.
L. Ibos, et al., “Infrared emissivity measurement device: principle and applications,” Meas. Sci. Technol., vol. 17, pp. 2950-2956, 2006.
R. Harrington, Field Computation by Moment Methods, New York: Macmillan, 1968.
T. Peters, et al., “Simulation of two-dimensional dielectric structures with resistive sheets,” The University of Michigan, Radiation Laboratory, no. 389055-1-F, 1986.
M. Abramowitz and I. Stegun, Handbook of Mathematical Functions, Washington DC, 1970.
