Selecting Sampling Interval in the Improved Spectral Domain Method to Simulate Microstrip Circuits

Authors

  • Zhuqian Gong School of Information Science & Technology, Sun Yat-sen University, Guangzhou 510006, China
  • Raj Mittra Electromagnetic Communication Laboratory, Pennsylvania State University, University Park, PA 16802, USA
  • Wenhua Yu Electromagnetic Communication Laboratory, Pennsylvania State University, University Park, PA 16802, USA
  • Xiaoling Yang Electromagnetic Communication Laboratory, Pennsylvania State University, University Park, PA 16802, USA
  • Jianyan Guo Electronic and Electrical Engineering Department, Xiamen University of Technology, Xiamen 361005, P.R.China,

Keywords:

Microstrip circuits, sampling interval, spectral domain method

Abstract

In this paper, we investigate the spectral method that calculates the S-parameters for microstrip circuits and antennas. A sampling interval selection criterion is proposed. The scheme for low-loss cases is specially discussed. Several examples are employed to demonstrate the engineering applications of the spectral domain method and its results are compared with previously published and measured results.

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Published

2021-10-06

How to Cite

[1]
Z. . Gong, R. . Mittra, W. . Yu, X. . Yang, and J. . Guo, “Selecting Sampling Interval in the Improved Spectral Domain Method to Simulate Microstrip Circuits”, ACES Journal, vol. 28, no. 02, pp. 85–90, Oct. 2021.

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