Transform Method for Dielectric Periodic Interface Scattering

Authors

  • L. Li Department of Electronics and Information Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
  • T. L. Dong Department of Electronics and Information Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
  • P. Chen Department of Electronics and Information Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
  • B. Y. Chen Department of Electronics and Information Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
  • Q. Huang Department of Electronics and Information Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
  • L. Lang Department of Electronics and Information Huazhong University of Science and Technology, Wuhan, 430074, P. R. China
  • Q. X. Li Department of Electronics and Information Huazhong University of Science and Technology, Wuhan, 430074, P. R. China

Keywords:

electromagnetic scattering, periodic surface, transform method

Abstract

An extended transform method is developed for calculating the 2-D scattering problem from dielectric periodic interfaces. The method transforms the problem into scattering from two imaginary planes, one of which cuts across the maximum points and another across the minimum points of the periodic interface. The fields just above and below the periodic interface are expanded into Taylor series with respect to the two planes respectively. Then by satisfying boundary condition, the unknown coefficients can be determined. Comparing with T-Matrix and MoM, proposed method is simpler in formulation and less in computational time. Near scattered field distributions above and in the trough region of the periodic interface are calculated by proposed method. The results are in good agreements with those of T-Matrix and MoM respectively.

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References

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Published

2021-11-12

How to Cite

[1]
L. . Li, “Transform Method for Dielectric Periodic Interface Scattering”, ACES Journal, vol. 27, no. 11, pp. 897–902, Nov. 2021.

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