High-Order Small Perturbation Method of Arbitrary Order for Conducting Rough Surface Scattering under TE Incidence

Authors

  • Qing Wang School of Electronic Engineering Xidian University, Xi’an, Shaanxi 710071, China
  • Chen Lin Second Research Department Yangzhou Marine Electronic Institute, Yangzhou, Jiangsu 225001, China
  • Zhen-Ya Lei School of Electronic Engineering Xidian University, Xi’an, Shaanxi 710071, China
  • Jianq-Qiang Hou School of Electronic Engineering Xidian University, Xi’an, Shaanxi 710071, China
  • Lei Li School of Electronic Engineering Xidian University, Xi’an, Shaanxi 710071, China

Keywords:

Bistatic scattering coefficients, highorder small perturbation method, rough surface scattering, tapered wave, TE incidence

Abstract

A novel closed-form high-order small perturbation method (HOSPM) for the analysis of scattering from 1-D conducting random rough surfaces under TE incidence is developed. The main theoretical contributions of the HOSPM are as follows: (1) our method yields a general high-order SPM form for scattered fields of arbitrary orders, (2) Faà di Bruno's formula is introduced into computational electromagnetics (CEM) for the first time to expand a tapered incident wave and its partial derivatives in power series form, and (3) the form is simple and easy to program and does not require any mathematical pretreatment. Comparisons are made between the method of moments (MOM) and different-order HOSPMs in terms of several aspects, including accuracy and time efficiency. The order convergence of the HOSPM is discussed, the regions of validity with regard to correlation lengths and root mean square (RMS) heights are demonstrated for the 2nd-order HOSPM, and the robustness of the 2nd-order HOSPM is proven over a broad range of frequencies

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Author Biographies

Qing Wang, School of Electronic Engineering Xidian University, Xi’an, Shaanxi 710071, China

Qing Wang was born Shaanxi, China, in 1984. She received the B.Eng. degree in Measuring and Control Technology and Instrumentations from Xidian University, China, in 2006 and Ph.D. degree in Electromagnetic Field and Microwave Technology from Xidian University, China, in 2012. From 2009 to 2011, she was a visiting student in Clemson University, USA. She is currently an Assistant Professor with the School of Electronic Engineering, Xidian University, Xi’an. Her research interests include computational electromagnetics and millimeter wave technology.

Chen Lin, Second Research Department Yangzhou Marine Electronic Institute, Yangzhou, Jiangsu 225001, China

Chen Lin was born in Jiangsu, China, in 1982. He received the B.Eng. Degree in Measuring and Control Technology and Instrumentations from Xidian University, China, in 2006 and Ph.D. degree in Electromagnetic Field and Microwave Technology from Xidian University, China, in 2011. He is currently a Senior Engineer with Yangzhou Marine Electronic Institute. His research interest contains radar system analysis and engineering, microwave engineering and electronically scanned arrays.

Zhen-Ya Lei , School of Electronic Engineering Xidian University, Xi’an, Shaanxi 710071, China

Zhen-Ya Lei was born in Shaanxi, China, in 1960. He received the B.Eng. degree in Computer Science from Xidian University, China, in 1981 and M.E. degree in Electromagnetic Field and Microwave Technology from Xidian University, China, in 1998. He was a visiting scholar in Ohio State University, U.S. in 2016. He is currently a Professor with the School of Electronic Engineering, Xidian University, Xi’an. His research interest contains microwave circuits and microwave engineering, Rf/microwave transmitter and the receiver, antenna, system-level EM field analysis, target characteristics and stealth design.

Jianq-Qiang Hou, School of Electronic Engineering Xidian University, Xi’an, Shaanxi 710071, China

Jian-Qiang Hou received the B.Eng. degree in Electromagnetic Field and Microwave Technology from Xidian University, China, in 1999, M.E. degree in Electromagnetic Field and Microwave Technology from Xidian University, China, in 2004 and Ph.D. degree in Electromagnetic Field and Microwave Technology from Xidian University, China, in 2012. He is currently an Associate Professor with the School of Electronic Engineering, Xidian University, Xi’an. His research interest contains microwave millimeter-wave circuits and systems and modeling and design of microwave devices.

Lei Li , School of Electronic Engineering Xidian University, Xi’an, Shaanxi 710071, China

Lei Li was born in 1980. He received the B.Eng. degree in Electronic Engineering from Shenyang Aerospace University, China, in 2001, M.E. degree in Electromagnetic Field and Microwave Technology from Xidian University, China, in 2005 and Ph.D. degree in Electromagnetic Field and Microwave Technology from Xidian University, China, in 2007. From 2015 to 2016, he was a visiting scholar in University of Montreal, Canada. He is currently an Associate Professor with the School of Electronic Engineering, Xidian University, Xi’an. His research interest contains substrate integrated waveguide and target characteristics.

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Published

2020-06-01

How to Cite

[1]
Qing Wang, Chen Lin, Zhen-Ya Lei, Jianq-Qiang Hou, and Lei Li, “High-Order Small Perturbation Method of Arbitrary Order for Conducting Rough Surface Scattering under TE Incidence”, ACES Journal, vol. 35, no. 6, pp. 601–612, Jun. 2020.

Issue

2020: Vol 35 Iss 6

Section

Articles