Improvement of Microwave Metamaterial Aperture Imager with Genetic Algorithm

Authors

  • Shuncheng Tian Key Laboratory of High Speed Circuit Design and EMC of Ministry of Education School of Electronic Engineering Xidian University, Xi’an, 710071, China
  • Long Li Key Laboratory of High Speed Circuit Design and EMC of Ministry of Education School of Electronic Engineering Xidian University, Xi’an, 710071, China

Keywords:

Complementary electric-LC element, imager, genetic algorithm, metamaterial, quality-factor

Abstract

The genetic algorithm is used to improve the imaging capability of the microwave metamaterial aperture imager operating at Ku-band. The microwave metamaterial aperture imager is made up of the complementary electric-LC elements and Jerusalem cross structures elements. Besides, the genetic algorithm is applied to optimize the array of the elements, which can reduce the average mutual coherence of the patterns of the microwave metamaterial aperture imager at different frequencies. Then, the patterns of the microwave metamaterial aperture imager is used for the image reconstruction experiments. From the image reconstruction results, it can be seen that the quality of the recovered image is improved. The performance of the microwave metamaterial aperture imager using the genetic algorithm is crucially enhanced and extensive simulations verify the effectiveness of the proposed improvement approaches.

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References

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Published

2019-07-01

How to Cite

[1]
Shuncheng Tian and Long Li, “Improvement of Microwave Metamaterial Aperture Imager with Genetic Algorithm”, ACES Journal, vol. 34, no. 07, pp. 1009–1014, Jul. 2019.

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