Loss Analysis of Wideband RF MEMS Shunt Capacitive Switch in T and Pi-Match Configurations

Authors

  • S. Suganthi Department of Electronics and Communication Engineering K. Ramakrishnan College of Technology, Tiruchirappalli, Tamilnadu, India
  • P. Thiruvalar Selvan Department of Electronics and Communication Engineering SRM-TRP Engineering College, Tiruchirappalli, Tamilnadu, India
  • S. Raghavan Department of Electronics and Communication Engineering National Institute of Technology, Tiruchirappalli, India

Keywords:

High impedance short transmission line, matched section, return loss and isolation, RF MEMS, shunt switch, wideband

Abstract

A wide bandwidth coplanar-waveguide (CPW) based RF MEMS capacitive shunt switch with pi-matched & T-matched having high impedance transmission lines is designed and simulated for broadband (18-40 GHz) application. The effects of variation in membrane width (50 & 70 mu m) of the switch and high-impedance transmission line length (300 – 600 mu m) between the switch structures on scattering parameters are studied. The variation in beam width has very little effect on return loss of the switch in up-state. The reduction in high-impedance transmission line length yields marginal improvement in return loss. In the down-state configuration, the return loss showed negligible change with the variation in beam width and high-impedance transmission line length. The isolation is found improved with the increase in beam width and high-impedance transmission line length in whole frequency range. Simulating the technical performance demonstrates the greater improvement in RF characteristics of the switch particularly in return loss in up-state position. In order to validate the obtained result, Artificial Neural Network (ANN) has been trained using ADS result. Comparison shows good agreement between ADS and ANN results.

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Published

2021-07-22

How to Cite

[1]
S. Suganthi, P. Thiruvalar Selvan, and S. Raghavan, “Loss Analysis of Wideband RF MEMS Shunt Capacitive Switch in T and Pi-Match Configurations”, ACES Journal, vol. 33, no. 09, pp. 1034–1039, Jul. 2021.

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