Reliability Test Plan Based on Logistic-Exponential Distribution and Its Application

Authors

  • Abhimanyu Singh Yadav Department of Statistics, Banaras Hindu University, India
  • Mahendra Saha Department of Statistics, Central University of Rajasthan, Rajasthan, India
  • Shivanshi Shukla Department of Statistics, Central University of Rajasthan, Rajasthan, India
  • Harsh Tripathi 1)Department of Statistics, Central University of Rajasthan, Rajasthan, India 2)Department of Mathematics, Lovely Professional University, Punjab, India
  • Rajashree Dey Department of Statistics, Central University of Rajasthan, Rajasthan, India

DOI:

https://doi.org/10.13052/jrss0974-8024.14215

Keywords:

Consumer’s risk, logistic-exponential distribution, operating characteristic curve, producer’s risk, reliability life test, termination ratio

Abstract

In this article, a reliability test plan is developed for Logistic-exponential distribution (LoED) under time truncated life test scheme. The distribution has been chosen because it can used to model lifetime of several reliability phenomenon and it performs better than many well known existing distributions. With the discussions of statistical properties of the aforesaid model, the reliability test plan has been established under the assumption of median quality characteristics when minimum confidence level P* is given. To quench the objective of the paper i.e; to serve as a guiding aid to the emerging practitioners, minimum sample sizes have been obtained by using binomial approximation and Poisson approximation for the proposed plan. Further, operating characteristic (OC) values for the various choices of quality level are placed. Also, minimum ratio of true median life to specified life has been presented for specified producer’s risk. Important findings of the proposed reliability test plan are given for considered value of k=0.75,1,2. To demonstrate the appropriateness of suggested reliability test plan is achieved using four real life situation.

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Author Biographies

Abhimanyu Singh Yadav, Department of Statistics, Banaras Hindu University, India

Abhimanyu Singh Yadav. Currently he is working as an assistant professor in Department of Statistics, Banaras Hindu University, India. His research area is: distribution theory, Bayesian and classical estimation, relibility theory. He has published more than 40 papers in reputed national and international journals.

Mahendra Saha, Department of Statistics, Central University of Rajasthan, Rajasthan, India

Mahendra Saha. Currently he is working as an assistant professor in Department of Statistics, Central University of Rajasthan, India. His research area is: distribution theory, Bayesian and classical estimation, statistical quality control. He has published more than 40 papers in reputed national and international journals.

Shivanshi Shukla, Department of Statistics, Central University of Rajasthan, Rajasthan, India

Shivanshi Shukla. Currently she is a research scholor in Department of Statistics, Central University of Rajasthan, India. Her research area is: distribution theory, Bayesian and classical estimation. She has published 2 papers in reputed international journals.

Harsh Tripathi, 1)Department of Statistics, Central University of Rajasthan, Rajasthan, India 2)Department of Mathematics, Lovely Professional University, Punjab, India

Harsh Tripathi. Currently he is working an assistant professor in Department of Mathematics, Lovely Professional University, Punjab, India. His research area is: distribution theory, Bayesian and classical estimation and statistical quality control. He has published 6 papers in reputed national and international journals.

Rajashree Dey, Department of Statistics, Central University of Rajasthan, Rajasthan, India

Rajashree Dey. She was a M.Sc student in Department of Statistics, Central University of Rajasthan, India. Her area of interest is reliability test plan.

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Published

2021-12-14

How to Cite

Yadav, A. S. ., Saha, M. ., Shukla, S. ., Tripathi, H. ., & Dey, R. . (2021). Reliability Test Plan Based on Logistic-Exponential Distribution and Its Application. Journal of Reliability and Statistical Studies, 14(02), 695–724. https://doi.org/10.13052/jrss0974-8024.14215

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