RELIABILITY TEST PLANS FOR TYPE-II EXPONENTIATED LOG-LOGISTIC DISTRIBUTION

Authors

  • G. Srinivasa Rao Department of Statistics, Dilla University, Dilla, PO Box: 419, Ethiopia.
  • R.R.L. Kantam Department of Statistics, Nagarjuna University, Guntur-522510, INDIA.
  • K. Rosaiah Department of Statistics, Nagarjuna University, Guntur-522510, INDIA.
  • S.V.S.V.S.V. Prasad Department of Statistics, Nagarjuna University, Guntur-522510, INDIA.

Keywords:

Type-II Exponentiated Log- logistic Distribution, Reliability Test Plans

Abstract

In this paper we consider a generalization of the log- logistic distribution called Type-II exponentiated log- logistic distribution suggested by Kotz and Nadarajah (2000). The operating characteristic for a sampling plan is determined for the case that a lot of products are submitted for inspection with lifetimes specified by a Type-II exponentiated log- logistic distribution (TELLD). The results are illustrated by a numerical example

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References

Baklizi, A. (2003). Acceptance sampling based on truncated life tests in the

Pareto distribution of the second kind, Advances and Applications in Statistics,

(1), p. 33-48.

Balakrishnan, N., Leiva, V. and Lopez, J. (2007). Acceptance sampling plans

from truncated life tests based on the generalized Birnbaum–Saunders

distribution, Communications in Statistics-Simulation and Computation, 36, p.

–656.

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Published

2012-06-05

How to Cite

Rao, G. S. ., Kantam, R. ., Rosaiah, K., & Prasad, S. . (2012). RELIABILITY TEST PLANS FOR TYPE-II EXPONENTIATED LOG-LOGISTIC DISTRIBUTION. Journal of Reliability and Statistical Studies, 5(01), 55–64. Retrieved from https://journals.riverpublishers.com/index.php/JRSS/article/view/21937

Issue

2012: Vol 5 Iss 1

Section

Articles