Stress and Strength Reliability Estimation for the Inverse Family of Distributions using Bayesian Analysis

Authors

  • Kuldeep Singh Chauhan Department of Statistics, Ram Lal Anand College, University of Delhi, India
  • Sachin Tomer Department of Statistics, Ramanujan College, University of Delhi, India

DOI:

https://doi.org/10.13052/jrss0974-8024.1921

Keywords:

Inverse family of distributions, stress-strength model, Bayesian estimation, squared error loss function, general entropy loss function, reliability function, bootstrap

Abstract

A Bayesian model to study stress-strength reliability P=P(Y<X), which makes use of parameters in the family of the inverse distributions. For the reliability function and for the stress-strength parameter, Bayes estimators are obtained under SELF and GELF. When this is appropriate, conjugate priors will be introduced into estimators, which will be constituted using different powers of the unknown parameters. Performance of these estimators is determined by a simulation-based methodology and large numbers of bootstrap replications. The findings show that, especially in small-sample circumstances, the Bayesian estimators based on SELF perform better than those based on GELF. The performance difference closes as the sample sizes grow. The exploration of this paper displays that the inverse family can be altered for several common distributions, which have more significant practical implications when analyzing reliability.

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Author Biographies

Kuldeep Singh Chauhan, Department of Statistics, Ram Lal Anand College, University of Delhi, India

Kuldeep Singh Chauhan is an assistant professor in the Department of Statistics at Ram Lal Anand College, University of Delhi, India. He holds a Ph.D. in Statistics, specializing in Reliability and Life Testing, awarded by Chaudhary Charan Singh University, Meerut. With over 14 years of teaching experience, He has published more than seven research papers in reputed journals.

Sachin Tomer, Department of Statistics, Ramanujan College, University of Delhi, India

Sachin Tomer is an associate professor in the Department of Statistics at Ramanujan College, University of Delhi, India. He has more than 15 years of teaching experience. Dr. Tomer completed his Ph.D. in Statistics in Reliability and Life Testing from Chaudhary Charan Singh University, Meerut. His research interests include Bayesian inference and reliability, and life testing. He has published more than 15 research papers in reputed journals.

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Published

2026-04-28

How to Cite

Chauhan, K. S. ., & Tomer, S. . (2026). Stress and Strength Reliability Estimation for the Inverse Family of Distributions using Bayesian Analysis. Journal of Reliability and Statistical Studies, 19(02), 241–262. https://doi.org/10.13052/jrss0974-8024.1921

Issue

Section

Advances in Reliability Studies