Broad-band Characterization of Wire Interconnects Using a Surface Integral Formulation with a Surface Effective Impedance

Authors

  • A. Maffucci Ass. EURATOM/ENEA/CREATE, DAEIMI Università degli Studi di Cassino, I-03043 Cassino (FR), Italy
  • S. Ventre Ass. EURATOM/ENEA/CREATE, DAEIMI Università degli Studi di Cassino, I-03043 Cassino (FR), Italy
  • F. Villone Ass. EURATOM/ENEA/CREATE, DAEIMI Università degli Studi di Cassino, I-03043 Cassino (FR), Italy
  • W. Zamboni Ass. EURATOM/ENEA/CREATE, DAEIMI Università degli Studi di Cassino, I-03043 Cassino (FR), Italy
  • G. Rubinacci Ass. EURATOM/ENEA/CREATE, DIEL Università degli Studi di Napoli “Federico II”, I-80125 Napoli, Italy

Keywords:

Broad-band Characterization of Wire Interconnects Using a Surface Integral Formulation with a Surface Effective Impedance

Abstract

A surface integral formulation is used for a broad-band characterization of wire interconnects. A suitable definition of effective impedance accounts for the penetration of currents and charges inside lossy conductors. The results are successfully compared to a volumetric integral approach.

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Published

2022-06-17

How to Cite

[1]
A. . Maffucci, S. . Ventre, F. . Villone, W. . Zamboni, and G. . Rubinacci, “Broad-band Characterization of Wire Interconnects Using a Surface Integral Formulation with a Surface Effective Impedance”, ACES Journal, vol. 23, no. 1, pp. 23–30, Jun. 2022.

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