2008: Vol 23 Iss 1

Articles

• An Improved Time-Domain Near-Field to Far-Field Transform in Two Dimensions

  J. A. Roden, S. L. Johns, J. Sacchini

  1-4

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• Efficient Time-domain Sensitivity Analysis using Coarse Grids

  Y. Song, N. K. Nikolova, M. H. Bakr

  5-15

  • PDF

• Practical Implementation of a CPML Absorbing Boundary for GPU Accelerated FDTD Technique

  M. J. Inman, A. Z. Elsherbeni, J. G. Maloney, B. N. Baker

  16-22

  • PDF

• Broad-band Characterization of Wire Interconnects Using a Surface Integral Formulation with a Surface Effective Impedance

  A. Maffucci, S. Ventre, F. Villone, W. Zamboni, G. Rubinacci

  23-30

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• High-Frequency Full-Wave Analysis of Interconnects with Inhomogeneous Dielectrics through an Enhanced Transmission Line Model

  A. G. Chiariello, G. Miano, A. Maffucci, F. Villone, W. Zamboni

  31-38

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• Circuit Models for Interconnects Using 3D Computational Techniques

  B. Essakhi, J. Benel, M. Smail, L. Pichon, G. Akoun

  39-45

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• Eddy Current Imaging of Surface Breaking Defects by Using Monotonicity Based Methods

  G. Rubinacci, A. Tamburrino, S. Ventre

  46-52

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• Design and Analysis of Partitioned Square Loop Antennas

  R. Hasse, W. Hunsicker, D. Kajfez, A. Elsherbeni, V. Demir

  53-61

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• Interval-Based Robust Design of a Microwave Power Transistor

  P. Lamberti , V. Tucci

  62-69

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• 7 Tesla MRI with RF Power and Field Homogeneity Comparable to 4 Tesla using Computational Electromagnetics

  L. Tang, T. S. Ibrahim

  70-75

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• On-Wafer Measurement and Modeling of Silicon Carbide MESFET’s

  L. Jordan, D. Elsherbeni, E. Hutchcraft, R. K. Gordon, D. Kajfez

  76-83

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• Extracting the Electrical Properties of Polymeric Composite Materials through Circuit Simulation and Optimization

  L. Bennett, W. E. Hutchcraft, R. K. Gordon, E. Lackey, J. G. Vaughan, R. Averill

  84-89

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• A Review of Statistical Methods for Comparing Two Data Sets

  A. Duffy, A. Orlandi

  90-97

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• Using MATLAB to Control Commercial Computational Electromagnetics Software

  R. L. Haupt

  98-103

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• Quantifying EMC Measurement Accuracy Using Feature Selective Validation

  A. Denton, A. Martin, A. Duffy

  104-109

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