An Accelerated Ray Tracing Method based on Embree3 Ray Tracing Library for Targets with Non-uniform Thickness Materials

Authors

  • Yi Zhu School of Electronics and Information Northwestern Polytechnical University, Xi’an 710129, China
  • Gao Wei School of Electronics and Information Northwestern Polytechnical University, Xi’an 710129, China
  • Jianzhou Li School of Electronics and Information Northwestern Polytechnical University, Xi’an 710129, China

DOI:

https://doi.org/10.13052/2024.ACES.J.390606

Keywords:

Accelerated ray tracing method, Thick materials, Electromagnetic scattering

Abstract

This paper proposes an accelerated ray tracing method utilizing the Embree3 ray tracing library for targets with non-uniform thickness materials. In contrast to the traditional surface-based ray tracing, the proposed approach performs ray tracing within the materials, since surface tracing is ineffective for materials with non-uniform thickness. To ensure efficiency and handle the overlapping grids between different materials, the Embree3 ray tracing library is introduced to ray intersection. Numerical results confirm that the proposed method surpasses existing methods in terms of efficiency and applicability while maintaining accuracy.

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Author Biographies

Yi Zhu, School of Electronics and Information Northwestern Polytechnical University, Xi’an 710129, China

Yi Zhu was born in Sichuan, China, in 1996. He received the B.S. and M.S. degrees in electromagnetic field and microwave technology from Northwestern Polytechnic University, Xi’an, China, in 2018 and 2021, respectively, where he is currently pursuing the Ph.D. degree. His research interests include computational electromagnetics.

Gao Wei, School of Electronics and Information Northwestern Polytechnical University, Xi’an 710129, China

Gao Wei was born in Shandong, China, in 1963. He received the B.S. and M.S. degrees in electromagnetic field and microwave technology from Northwestern Polytechnic University, Xi’an, China. He is currently a professor with the School of Electronics and Information in Northwestern Polytechnic University. His current research interests include antenna theory and techniques, microwave measurement, and microwave application.

Jianzhou Li, School of Electronics and Information Northwestern Polytechnical University, Xi’an 710129, China

Jianzhou Li was born in Shaanxi, China, in 1972. He received the Ph.D. degree from Northwestern Polytechnic University, Xi’an, China, in 2005. He received a P.D. degree in Surrey Satellite Center in University of Surrey, UK, in 2009. He is currently an associate professor with the School of Electronics and Information in Northwestern Polytechnic University. His current research interests include antenna theory and techniques, and computational electromagnetics.

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Published

2024-06-30

How to Cite

[1]
Y. Zhu, G. Wei, and J. Li, “An Accelerated Ray Tracing Method based on Embree3 Ray Tracing Library for Targets with Non-uniform Thickness Materials”, ACES Journal, vol. 39, no. 06, pp. 527–532, Jun. 2024.