An Accelerated Ray Tracing Method based on Embree3 Ray Tracing Library for Targets with Non-uniform Thickness Materials
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https://doi.org/10.13052/2024.ACES.J.390606关键词:
Accelerated ray tracing method, Thick materials, Electromagnetic scattering摘要
This paper proposes an accelerated ray tracing method utilizing the Embree3 ray tracing library for targets with non-uniform thickness materials. In contrast to the traditional surface-based ray tracing, the proposed approach performs ray tracing within the materials, since surface tracing is ineffective for materials with non-uniform thickness. To ensure efficiency and handle the overlapping grids between different materials, the Embree3 ray tracing library is introduced to ray intersection. Numerical results confirm that the proposed method surpasses existing methods in terms of efficiency and applicability while maintaining accuracy.
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