A Methodology to Identify Crosstalk Contributor from 6-Line Suspension Assembly Interconnect of Ultra-High Capacity Hard Disk Drives

Authors

  • K. Prachumrasee KKU-Seagate Cooperation Research Laboratory, Department of Electrical Engineering, Khon Kaen University, Khon Kaen, 40002, Thailand
  • A. Siritaratiwat KKU-Seagate Cooperation Research Laboratory, Department of Electrical Engineering, Khon Kaen University, Khon Kaen, 40002, Thailand
  • V. Ungvichian EMI Research Laboratory, College of Engineering and Computer Science, Florida Atlantic University, Boca Raton, FL 33431, USA
  • Roong Sivaratana Seagate Technology (Thailand) Co., Ltd., 90 Friendship Road, Nakhonratchasima 30170, Thailand
  • A. Kaewrawang KKU-Seagate Cooperation Research Laboratory, Department of Electrical Engineering, Khon Kaen University, Khon Kaen, 40002, Thailand

Keywords:

A Methodology to Identify Crosstalk Contributor from 6-Line Suspension Assembly Interconnect of Ultra-High Capacity Hard Disk Drives

Abstract

The crosstalk phenomenon on the suspension assembly interconnecting trace (SAIT) in hard disk drives (HDD) causes the signal to deform and/or degrade the recording head. For the purpose of analyzing the crosstalk contributions from SAIT using the 3D electromagnetic simulation tool, SAIT is divided into 4 sections which are bend section (BS), far-end section (FS), straight section (SS), and near-end section (NS). The length of each section is selected based on the physical shape of the trace and characteristic impedance. From the results, it was observed that the lowest crosstalk occurs at the BS and the highest crosstalk occurs at the NS. NS is necessary during a HDD quality evaluation and is removed before the SAIT installed in the HDD. With such high crosstalk, the test results can indicate poor head performance even when the head is working properly. Moreover, the crosstalk can be suppressed up to 14 dB and 33 dB for the near-end side and the far-end side, respectively when the NS with a 100% filled stainless steel backing layer is applied to the SAIT. Hence, to improve the accuracy of the recording head test performance, the designer should put more effort to design the SAIT near-end section to minimize crosstalk.

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Author Biographies

K. Prachumrasee, KKU-Seagate Cooperation Research Laboratory, Department of Electrical Engineering, Khon Kaen University, Khon Kaen, 40002, Thailand

Krisada Prachumrasee is a Ph.D.
candidate after he obtained B. Eng.
(EE) and M. Eng. (EE) from Khon
Kaen Uiversity. He was granted the
M. Eng. Scholarship from the
Industrial/University Cooperative
Research Center in HDD
Component (I/U CRC in HDD
Component) supported by the Ministry of Science and
Technology. With good performance thesis of his
Master degree study, he has received a PhD scholarship
from Graduate School, Khon Kaen University under the
research fund for high potential student to continue
postgraduate study.

A. Siritaratiwat, KKU-Seagate Cooperation Research Laboratory, Department of Electrical Engineering, Khon Kaen University, Khon Kaen, 40002, Thailand

Apirat Siritaratiwat received his
B.Eng. (EE) from Khon Kaen
University in 1992. After working
in the industry for few years, he
joined the Department of Electrical
Engineering, Khon Kaen University
in 1994 and continued his
postgraduate study at the University
of Manchester, UK, between 1995-1999. He has served
in many managerial positions such as Head of
Department, Assistant to President for Research Affairs
etc. He has done researches in HDD and been one of
pioneer researchers of ESD/EOS and EMI in recording
heads. Since his researches are mainly jointed with
HDD industry, it leaded to the establishment of the
KKU-Seagate Cooperation Research Laboratory and
the I/U CRC in HDD Component where he was
Director. He has published more than 80 articles and
held 4 pending patents

V. Ungvichian, EMI Research Laboratory, College of Engineering and Computer Science, Florida Atlantic University, Boca Raton, FL 33431, USA

Vichate Ungvichian was born in
Bangkok, Thailand. He received his
Ph.D. degree inElectrical
Engineering specialized in
Electromagnetic from the Ohio
University, Athens, Ohio, in 1981.
Since 1982, he has been with
the Department of Electrical &
Computer Engineering and Computer Science, Florida
Atlantic University, Boca Raton, Florida, USA. He is a
Full Professor and in the past 28 years as the Director
of the EMI Lab.He is a senior member of IEEE,
Advisor of IEEE FAU Student Chapter and Advisor of
τβπ Engineering Honor Society.

Roong Sivaratana, Seagate Technology (Thailand) Co., Ltd., 90 Friendship Road, Nakhonratchasima 30170, Thailand

Roong Sivaratana earned his
B.Eng. from KMUT, North
Bangkok, and M. Eng. From
Warick University, UK. He has
been Senior Director at Seagate for
years and emphasized on Test
Engineering and Development. He
has published papers with academia
and advised postgraduate students in his expertise area
of HDD development.

A. Kaewrawang, KKU-Seagate Cooperation Research Laboratory, Department of Electrical Engineering, Khon Kaen University, Khon Kaen, 40002, Thailand

Arkom Kaewrawang obtained his
B. Eng. (EE), Horn, from Khon
Kaen University, M. Eng.(EE)
from Chulalongkorn University,
and Ph.D. from Shinshu
University, Japan. He has done
researches with HDD industry in
the area of magnetic materials and
high frequency effects to recording heads. He has
published more than 20 international articles with many
outstanding awards from various sources.

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Published

2022-05-02

How to Cite

[1]
K. . Prachumrasee, A. . Siritaratiwat, V. . Ungvichian, R. . Sivaratana, and A. . Kaewrawang, “A Methodology to Identify Crosstalk Contributor from 6-Line Suspension Assembly Interconnect of Ultra-High Capacity Hard Disk Drives”, ACES Journal, vol. 27, no. 1, pp. 22–27, May 2022.

Issue

2012: Vol 27 Iss 1

Section

General Submission