Characterizing Infrared Frequency Selective Surfaces on Dispersive Media

Authors

  • James Ginn CREOL - College of Optics and Photonics University of Central Florida, Orlando, FL 32816, USA
  • David Shelton CREOL - College of Optics and Photonics University of Central Florida, Orlando, FL 32816, USA
  • Jeffrey Tharp CREOL - College of Optics and Photonics University of Central Florida, Orlando, FL 32816, USA
  • William Folks CREOL - College of Optics and Photonics University of Central Florida, Orlando, FL 32816, USA
  • Glenn Boreman CREOL - College of Optics and Photonics University of Central Florida, Orlando, FL 32816, USA
  • Brian Lail Department of Electrical and Computer Engineering Florida Institute of Technology, Melbourne, FL 32901, USA

Keywords:

Characterizing Infrared Frequency Selective Surfaces on Dispersive Media

Abstract

With the emergence of frequency selective surfaces (FSS) and other passive planar antenna devices at infrared frequencies, the increasing need for accurate characterization using numerical modeling prior to device fabrication has exposed limitations in the traditional modeling procedures used for lower frequency FSS designs. To improve full-wave FSS models at IR, a procedure to measure and integrate dispersive material properties in modeling is described. Measured and modeled results are provided as verification demonstrating the need to account for material dispersion in infrared FSS design.

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Published

2022-06-18

How to Cite

[1]
J. . Ginn, D. . Shelton, J. . Tharp, W. . Folks, G. . . Boreman, and B. . Lail, “Characterizing Infrared Frequency Selective Surfaces on Dispersive Media”, ACES Journal, vol. 22, no. 1, pp. 184–188, Jun. 2022.

Issue

2007: Vol 22 Iss 1

Section

General Submission