Ultra-thin Coating Materials Sensor Based on Constitutive Parameters Near-zero Media

Authors

  • Si Hui Jia Shanghai Collaborative Innovation Center of Intelligent Sensing Chip Technology Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200444, China
  • Yu Wei Mao Shanghai Collaborative Innovation Center of Intelligent Sensing Chip Technology Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200444, China
  • Qiao Yu Li Shanghai Collaborative Innovation Center of Intelligent Sensing Chip Technology Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200444, China
  • Zi Jian Gao Shanghai Collaborative Innovation Center of Intelligent Sensing Chip Technology Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200444, China
  • Zi Peng Shan
  • Yong Jin Zhou State Key Laboratory of Millimeter Waves School of Information Science and Engineering, Southeast University, Nanjing 210096, China

DOI:

https://doi.org/10.13052/2024.ACES.J.400605

Keywords:

Constitutive parameters near-zero media, high accuracy, microwave sensor, ultra-thin coating material

Abstract

Microwave absorbing materials, which serve as essential functional components, are increasingly vital to stealth systems in military equipment. Accurate measurement of the electromagnetic parameters of absorbing coatings is crucial for achieving stealth effects. This study introduces a high-precision curved microwave sensor based on constitutive parameters near-zero (CPNZ) media, which uses thickness and complex permittivity as key test parameters. The complex permittivity and thickness of several typical absorbing materials were evaluated and benchmarked against other sensors. The detection limit of a CPNZ sensor for curved thickness is 0.5 mm, and the relative error of relative dielectric constant is less than 8%. Given the material thickness and resonant frequency, the relative error in the inversion of the dielectric constant is less than 3%. The calculated values closely correspond with the reference values, highlighting the CPNZ sensor’s enhanced accuracy and reliability for material characterization.

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Author Biographies

Si Hui Jia, Shanghai Collaborative Innovation Center of Intelligent Sensing Chip Technology Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200444, China

Si Hui Jia is currently pursuing the doctor’s degree in Electronic Science and Technology at Shanghai University, Shanghai 200444, China. He received the master’s degree in electronics and communication engineering from Yangtze University, Jingzhou 434023, China, in 2022. His current research is in the direction of microwave sensing.

Yu Wei Mao, Shanghai Collaborative Innovation Center of Intelligent Sensing Chip Technology Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200444, China

Yu Wei Mao received the B.S. degree from Bengbu College, Bengbu, China, in 2015, and the master’s degree in Communication and Information Engineering at Shanghai University, Shanghai 200444, China, in 2018. Her current research is focused on near-zero medium sensor technology.

Qiao Yu Li, Shanghai Collaborative Innovation Center of Intelligent Sensing Chip Technology Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200444, China

Qiao Yu Li is currently pursuing the doctor’s degree in Electromagnetic Field and Microwave Technology in Shanghai University, Shanghai 200444, China. She received the B.S. degree in Engineering from Henan Normal University, Xinxiang, China, in 2016, received the master’s degree in Electromagnetic Field and Microwave Technology from Shanghai University, Shanghai 200444, China, in 2019. Her current research is focused on plasmonic sensor devices.

Zi Jian Gao, Shanghai Collaborative Innovation Center of Intelligent Sensing Chip Technology Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200444, China

Zi Jian Gao was born in Tongcheng, Anhui Province, China, in 1998. Currently, he is pursuing a master’s degree in communication and information systems at Shanghai University, China, and his research interests are microwave sensing and algorithms.

Yong Jin Zhou, State Key Laboratory of Millimeter Waves School of Information Science and Engineering, Southeast University, Nanjing 210096, China

Yong Jin Zhou received the B.S. degree in communication engineering from Shandong University, Jinan, China, in 2006, and Ph.D. degree in electromagnetic field and microwave technology from Southeast University, Nanjing, China, in 2011. From 2009 to 2010, he was a visiting scholar of University of Houston. From 2011 to 2012, he was a software engineer with EEBU of Marvell Technology (Shanghai) Ltd. From 2012 to 2015, he was an Assistant Professor with School of Communication & Information Engineering, Shanghai University, Shanghai, China. From 2015, he was an Associate Professor with School of Communication & Information Engineering, Shanghai University, Shanghai, China. From 2020, he was a Professor with School of Communication & Information Engineering, Shanghai University, Shanghai, China. His current research interests include plasmonic metamaterials, millimeter wave and THz functional devices, wireless energy transmission, and computational electromagnetism. He has served as Applied Computational Electromagnetics Society (ACES) Journal guest editor and is serving as a Youth Editorial Board Member Journal of Electronics & Information Technology . He is serving as a Reviewer for over 20 peer-reviewed journals, such as Nature Electronics, Photonic Research, Optics Letter, Optics Express, Appl. Phys. Express, IEEE Access, IEEE MTT, and IEEE MWCL . He has served as a session chair for several International Symposiums.

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Published

2025-06-30

How to Cite

[1]
S. H. . Jia, Y. W. . Mao, Q. Y. . Li, Z. J. . Gao, Z. P. Shan, and Y. J. . Zhou, “Ultra-thin Coating Materials Sensor Based on Constitutive Parameters Near-zero Media”, ACES Journal, vol. 40, no. 06, pp. 525–533, Jun. 2025.

Issue

2025: Vol 40 Iss 6

Section

General Submission

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