Microstrip Patch Sensors for Complex Permittivity Measurement of Medium Loss Liquids Using 3D-FDTD
Keywords:
Microstrip patch resonator, microwave chemistry, permittivity measurement, 3D-FDTDAbstract
Two novel microstrip resonators are designed to measure the complex permittivity of medium loss liquids. These resonators have two layers, the first one is the sample layer and the second one is the base layer that the patch is printed on it. The base layer is suspended or inverted on the sample layer and the S-parameter is measured. The complex permittivity of the sample layer is extracted from the resonance frequency and the 3-dB bandwidth of the S-parameter. In this paper, binary mixtures of ethanol and methanol are used as sample layer. FDTD is a well-known computational method and is used for analyzing the structures. The experimental results for both of these resonators are really good and agree with reference values.
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References
E. Nyfors, and P. Vainikainen, Industrial Microwave Sensors. Artech House, USA, 1989.
H. Baltes, W. Gopel, and J. Hesse (Eds.), Sensors Update. Wiley Inc, Germany, vol. 7, 2000.
L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and V. K. Varadan, Microwave Electronics, Measurement and Materials Characterization. John Wiley & Sons, USA, 2004.
A. V. Hippel, Dielectric Materials and Application. Artech House, USA, 1995.
A. V. Hippel, Dielectrics and Wave. Artech House, USA, 1995.
A. Taflove, and S. C. Hagness, Computational Electrodynamics: The Finite-Difference TimeDomain Method. Artech House, USA, 2000.
Dennis M. Sulivan, Electromagnetic Simulation Using The FDTD Method. IEEE Press, 2000.
S. I. Ganchev, N. Qaddoumi, S. Bakhtiari, and R. Zoughi, “Calibration and measurement of dielectric properties of finite thickness composite sheets with open-ended coaxial sensors,” IEEE Trans. on Instrument, and Meas, vol. 44, pp. 1023-1029, 1995.
U. C. Hasar, “Permittivity determination of fresh cement-based materials by an open-ended waveguide probe using amplitude-only measurements,” Progress In Electromagnetics Research, PIER 97, pp. 27-43, 2009.
R. Huang and D. Zhang, “Application of mode matching method to analysis of axisymmetric coaxial discontinuity structures used in permeability and/or permittivity measurement,” Progress In Electromagnetics Research, PIER 67, pp. 205-230, 2007.
P. Queffelec and P. Gelin, “Influence of higher order modes on the measurements of complex permittivity and permeability of materials using a microstrip discontinuity,” IEEE Trans. Microw. Theory Tech, vol. 44, no. 6, pp. 816-824, 1996.
D. Shimin, “A new method for measuring dielectric constant using the resonant frequency of a patch antenna,” IEEE Trans. Microw. Theory Tech, vol. 34, no. 9, pp. 923-931, 1986.
Y. K. Verma and A. K. Verma, “Accurate determination of dielectric constant of substrate materials using modified Wolff model,” IEEE MTT-S Int. Microw. Symp. Dig, pp. 1411-1414, 2000.
M. Bogosanovich, “Microstrip patch sensor for measurement of the permittivity of homogeneous dielectric materials,” IEEE Trans. on Instrument, and Meas, vol. 49, no. 5, pp. 1145-1148, 2000.
A. K. Verma and Nasimuddin, “Determination of dielectric constant and loss-tangent of substrate sheet using microstrip patch resonator,” Microw. Opt. Technol. Lett., vol. 35, no. 3, pp. 175-179, 2002.
L. Changjun and P. Yang, “A microstrip resonator with slotted ground plane for complex permittivity measurements of liquids,” IEEE Microw. Wireless Compon. Lett, vol. 18, no. 4, pp. 257-259, 2008.
A. K. Verma, Nasimuddin, and A. S. Omar, “Microstrip resonator sensors for determination of complex permittivity of materials in sheet, liquid and paste forms,” IEE Proc. Microw. Antennas Propag., vol. 152, no. 1, pp. 48-54, 2005.
J. Hinojosa, K. Lmimouni, S. Lepilliet, and G. Dambrine, “Very high broadband electromagnetic characterization method of film-shaped materials using coplanar waveguide,” Microw. Opt. Technol. Lett., vol. 33, pp. 352-355, 2002.
Z. Bao, M. L. Swicord, and C. Davis, “Microwave dielectric characterization of binary mixtures of water, methanol, and ethanol,” Journal of Chemical Physics, vol. 104, pp. 4441-4450, 1996.
