Solid Characterization Utilizing Planar Microwave Resonator Sensor
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https://doi.org/10.13052/2022.ACES.J.370211关键词:
Planar microwave resonator, solid sample, high Q-factor摘要
This paper outlines the design and the implementation of a planar microwave resonator sensor for sensing application using the perturbation concept in which the dielectric characteristics of the resonator influence the quality factor (QF) and the resonance frequency. The designed sensor is fabricated using Roger 5880, and it is operating at 2.27 GHz in ranges of 1-3 GHz for testing solid materials. In addition, applying a specific experimental methodology, practical material is used as material samples such as those in Roger 5880, Roger 4350, and FR4. To investigate the microwave resonator sensor performance, an equivalent circuit model (ECM) is introduced. The proposed sensor has achieved a narrow bandwidth and high QF value of 240 at an operating frequency of 2.27GHz. Besides, the sensitivity and accuracy of the sensor is more than 80%, which makes this sensor an excellent solution to characterize the material, especially in discovering the material characteristics and quality.
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