A Critical Examination of Receive and Transmit Scan Element Pattern for Phased Arrays
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A Critical Examination of Receive and Transmit Scan Element Pattern for Phased Arrays摘要
The measurement of Scan Element Pattern by exciting only the center element is evaluated, both for gain at broadside and for behavior versus scan (normalized at broadside). A large dipole array of 50 × 50 elements is used in a 64 bit computer test bed, for calculations including mutual impedance. These results are compared with those where all elements are properly excited. A simple rigorous derivation of SEP including impedance mismatch is presented.
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