Applications of the Transmission Line Matrix Method to Microwave Scanning Microscopy
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Applications of the Transmission Line Matrix Method to Microwave Scanning Microscopy摘要
A three-dimensional transmission-line matrix (TLM) model was developed to simulate microwave-scanning microscopy. A TLM algorithm that allows the simulation of the scanning was developed. Numerical modeling was carried out for frequencies that are commonly used in microwave nondestructive testing (1GHz – 20GHz). Structures with local discontinuities in the electric permittivity are modeled numerically. The excitation parameters used in numerical modeling of scanning microwave microscopy were determined based on an initial frequency experimental response obtained from a plate with known permittivity. The numerical model developed in this paper is based on the symmetric condensed node. The description of the TLM algorithm is given in a Hilbert space using a three-index notation.
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