A Study on the Distribution and Uniformity of Symmetric Extended TEM Cells
关键词:
Electric field, field uniformity, TEM Cells, uncertainty摘要
TEM Cells can generate computable standard fields, which are often used in electromagnetic measurement systems. Their electromagnetic field uncertainty has a great influence on the evaluation of system measurement results. In this paper, a method and index for rigorous evaluation of the uniformity of electromagnetic field distribution in the test area are presented. The relationship between different measurement accuracies and the size limits of the test object is analyzed by HFSS. According to this relationship, the limit condition of the sample size is established when the E field measurement accuracy is 1dB. Among them, the height requirements are consistent with the traditional experience requirements, and the width requirements are more stringent. On this basis, the electric field distribution law of the symmetric extended TEM chamber is studied and analyzed. It shows that the field uniformity of the symmetric extended TEM room is basically unchanged when the test space is multiplied.
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参考
M. L. Crawford, “Generation of standard EM fields using TEM transmission cells,” IEEE Transactions on Electromagnetic Compatibility, vol. EMC-16, no. 3, pp. 189-195, Nov. 1974.
IEEE. STD 1309-2013, IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding Antennas, From 9 kHz to 40 GHz, 2013.
M. T. Ma, M. Kanda, M. L. Crawford, and E. B. Larsen, “A review of electromagnetic compatibility/ interference measurement methodologies,” Proceedings of the IEEE, vol. 73, no. 3, pp. 388-411, Mar. 1985.
M. L. Crawford and J. L. Workman, “Using a TEM Cell for EMC Measurement of Electronic Equipment,” U. S. National Bureau of Standards Technical Note 1013, Apr. 1979.
X. Lu, “Characteristic impedance variation of the TEM cell caused by the introduction of the equipment under test,” IEICE/IEEE International Symposium on Electromagnetic Compatibility, Tokyo, Japan, pp. 596-599, May 1999.
P. Wilson and M. Ma, “Simple approximate expressions for higher order mode cutoff and resonant frequencies in TEM cells,” IEEE Transactions on Electromagnetic Compatibility, vol. 28, no. 3, pp. 125-130, Aug. 1986
K. Malathi and D. Annapurna, “Numerical analysis of impedance of asymmetric TEM cell filled with inhomogeneous, isotropic dielectric,” Applied Computational Electromagnetics Society Journal, vol. 19, pp. 39-45, 2004.
D. Virginie, “Optimization of three-dimensional TEM cell for electromagnetic compatibility testing,” 20th Annual Review of Progress in Applied Computational Electromagnetics, 2004.
F. Dai, M. Wang, and D. L. Su, “A design of new twin TEM cells,” IEEE 2005 International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications Proceedings, vol. 1, pp. 10-13, 2005.
C. J. Song and X. Y. Feng, “A new design and implementation of expanding testing space of a transverse electromagnetic cell,” The 9th International Conference on Microwave and Millimeter Wave Technology, vol. 2, pp. 967-969, 2016.
D. A. Hill, “Bandwidth limitation of TEM cells due to resonances,” Journal of Microwave Power, vol. 18, no. 2, pp. 181-195, 1983.